Presentation Information

9:40 AM - 10:10 AM JST(12:40 AM - 1:10 AM UTC)EnglishKeynote Lecture

[A1422-1am-03]In-vitro diagnostic analysis based on semiconductor-enhanced Raman spectroscopy

○Tingting Zheng¹, Enduo Feng¹, Yan Zhou¹, Jia Liu¹, Yang Tian¹ (1. East China Normal University)

Surface enhanced Raman scattering,Semiconductor nanomaterial,In-vitro diagnostic analysis,Novel analytical method