講演情報

9:40 〜 10:10英語Keynote Lecture

[A1422-1am-03]In-vitro diagnostic analysis based on semiconductor-enhanced Raman spectroscopy

○Tingting Zheng¹、Enduo Feng¹、Yan Zhou¹、Jia Liu¹、Yang Tian¹ (1. East China Normal University)

Surface enhanced Raman scattering,Semiconductor nanomaterial,In-vitro diagnostic analysis,Novel analytical method