Presentation Information
[MoB3-02]Growth Kinetics and In-situ Etching in the Metalorganic Vapor Phase Epitaxy of GeO2
〇Giuditta Cicconi1,2, Matteo Bosi2, Wenshan Chen3, Oliver Bierwagen3, Andrea Baraldi1, Francesco Mezzadri4, Luca Seravalli2, Antonella Parisini1, Roberto Fornari1,2, Piero Mazzolini1,2 (1. Department of Mathematical, Physical and Computer Sciences, Univ. of Parma, Parma (Italy), 2. IMEM-CNR, Parma (Italy), 3. Paul-Drude-Inst. for Solid State Electronics, Berlin (Germany), 4. Department of Chemical, Life and Environmental Sustainability Sciences, Univ. of Parma, Parma (Italy))
Rutile GeO2 is affirming itself as a promising ultra-wide bandgap semiconductor for power electronics applications. In this work we demonstrate that - during deposition in a metalorganic vapor phase epitaxy environment - the formation and partial desorption of the intermediate suboxide GeO can limit its growth window. Moreover, we propose a reaction pathaway for GeO2 deposition, starting from isobutylgermane and O2 as precursors. In the end, by strategically exploiting GeO desorption, we demonstrate the possibility to obtain a controlled etching of the material, as a function of the provided isobutylgermanium flux.
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