Presentation Information
[SuB4-02]Resolving Hydrogen-associated Instability Issue for High-mobility Oxide (HMO) Thin-film Transistor
〇Mamoru Furuta1, Yoshihiro Sato2, Takafumi Kambe2, Tsutomu Satoyoshi2 (1. Kochi Univ. of Technol. (Japan), 2. Tokyo Electron Technology Solutions Ltd. (Japan))
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