Presentation Information
[ThA1-05]Short-cavity InAs/GaAs Quantum-Dot Lasers with 25-nm GaAs Spacers
〇Hexing Wang1, Huiwen Deng1, Jae-Seong Park1, Xuanchang Zhang1, Cong Lu2, Haifen Kan1, Haotian Zeng1, Yangqian Wang1, Dominic Gallagher3, Junhao Liu1, Danqi Lei1, Hui Jia1, Wei Li2, Peter M. Smowton4, Siming Chen1, Alwyn Seeds1, Huiyun Liu1, Mingchu Tang1 (1. Dept. Electron. & Electr. Eng., Univ. College London (UK), 2. College Mater. Sci. & Eng., Beijing Univ. Tech. (China), 3. Photon Design (UK), 4. School Phys. & Astron., Cardiff Univ. (UK))
Thick GaAs spacers (>37.5 nm) are widely used in stacked InAs/GaAs quantum dot (QD) lasers to avoid strain accumulation. However, these thick spacers reduce volumetric dot density and increase carrier transport time, therefore limiting the modal gain and modulation bandwidth. Here, we reduced the GaAs spacer thickness to 25 nm while maintaining optical and structural qualities, confirmed by photoluminescence (PL) and bright-field scanning transmission electron microscopy (BF-STEM). Ridge waveguide lasers incorporating the 11-layer QDs show a low threshold current density of 178 A/cm2 at room temperature (pulsed) and sustains lasing up to 180 °C. Furthermore, the ground-state lasing is observed in a short 200-μm cavity device without high reflectivity coatings, and the threshold modal gain was estimated to be above 60 cm-1. These results show that thin spacer design gives a viable route towards the high temperature and high gain QD lasers for next-generation optical interconnects.
Comment
To browse or post comments, you must log in.Log in
