Presentation Information
[TuC2-01]Advances and Integration Strategies for High-k Gate Dielectrics in GaN and SiC Power Devices
〇Andrew T. Binder1, Jeff Steinfeldt1, Joseph P. Klesko1, Peter Dickens1, Kevin Reilly1, Robert J. Kaplar1 (1. Sandia National Labs. (USA))
Password required to view
Comment
To browse or post comments, you must log in.Log in
