Presentation Information

[TuC2-04]627-V Fully-vertical GaN-on-SiC Trench MOSFETs and Demonstration of Large-Area Hexagonal Trench Devices

〇Jialun LI1, Xuancong Fan2, Hui Guo1, Yuanzhi He1, Renqiang Zhu1, Kei May Lau1 (1. Division of Emerging Interdisciplinary Area, The Hong Kong Univ. of Sci. and Tech. (Hong Kong), 2. Department of Electronic and Computer Engineering, The Hong Kong Univ. of Sci. and Tech. (Hong Kong))
In this work, we demonstrate 627-V fully-vertical GaN-on-SiC trench MOSFETs with good ON-state performance. The best device, with a 7-μm-thick drift layer, features a high JDS,max of 2.8 kA/cm2, an RON,sp of 7.6 mΩ·cm2 and a Vth of 4.5 V. The single-trench device is successfully scaled to large-area hexagonal trench devices, achieving a high ON-state current of 2.2 A while maintaining a 380 V breakdown voltage.

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