Presentation Information
[TuP3A-07]Direct Quantitative Visualization of Band Profile across III-V Devices using Kelvin Probe Force Microscopy
〇Nobuyuki Ishida1, Takuya Kawazu1, Akihiro Ohtake1, Takaaki Mano1 (1. National Inst. for Materials Sci. (NIMS) (Japan))
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