Presentation Information
[TuP3C-04]Investigation of Gate Reliability of p-GaN Gate AlGaN/GaN MIS-HEMTs with a GaON/Al2O3 Gate Dielectric Stack
〇Si-Hong Chen1, Shao-hsiang Hsu1, Sheng-Kai Chen Chen1, Chieh-Siang Kuo1, Jen-Inn Chyi1 (1. National Central University (Taiwan))
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