The 65th Battery Symposium in Japan
日本語
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Wed. Nov 20, 2024
Thu. Nov 21, 2024
Fri. Nov 22, 2024
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2:20 PM - 2:40 PM JST
(5:20 AM - 5:40 AM UTC)
[1A17]
安全性高速スクリーニングプロトコル
*Atsuo Yamada
1
, Seongjae Ko
1
, Hiromi Otsuka
2
, Shin Kimura
2
, Shoji Yamaguchi
2
, Takuya Masuda
2
(1. The University of Tokyo, 2. NIMS)
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Keywords:
安全性,ARC,小型円筒型パウチセル
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