Advanced Battery Collaboration (COI-NEXT) Symposium

2:20 PM - 2:40 PM JST(5:20 AM - 5:40 AM UTC)

[1A17] 安全性高速スクリーニングプロトコル

*Atsuo Yamada¹, Seongjae Ko¹, Hiromi Otsuka², Shin Kimura², Shoji Yamaguchi², Takuya Masuda² (1. The University of Tokyo, 2. NIMS)

Keywords:

安全性,ARC,小型円筒型パウチセル