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[1F26]オペランドX線CT法を用いたシリコン・Li6PS5Cl固体電解質の接触界面観察

*Mao Matsumoto1, Yuya Sakka1, Chengchao Zhong1, Keiji Shimoda1, Ken-ichi Okazaki1, Hisao Yamashige2, Takashi Ozeki3, Toshiaki Matsui3, Yuki Orikasa1 (1. Ritsumeikan University, 2. Toyota Motor Corporation, 3. Kyoto University)
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Keywords:

シリコン,X線CT,固体電解質接触界面