Lithium Ion Battery (Large-Scale: Evaluation)

9:20 AM - 9:40 AM JST(12:20 AM - 12:40 AM UTC)

[2A02] SPM導電性マッピングによるLIB正極合材内の導電パス劣化機構解析

*Hidemasa Tsuneishi¹, Kaede Makiuchi¹, Nagano Yasuko¹ (1. KOBELCO RESEARCH INSTITUTE, INC.)

Keywords:

Scanning Probe Microscopy,Scanning Spreading Resistance Microscopy,electron conductivity