Presentation Information
[1I20]Nafion膜を用いるハーフセルでのPt/C触媒劣化のIL-FE-SEM観察とAI解析
*ryota yokono1, Miki Matuoka2, Yasuhiko Arai2, Taro Kinumoto2 (1. Graduate School of Engineering, Oita University, 2. Faculty of Science and Technology, Oita University)
Keywords:
触媒劣化,同一箇所観察,AI解析