[8] Session 8 (C. Nanotechnologies for Electronics)

3:30 PM - 3:45 PM JST(6:30 AM - 6:45 AM UTC)

[8-03] Local luminescence characterization of gallium nitride semiconductors with pit structures by wavelength angle-resolved cathodoluminescence method

*Shota Usami¹, Zentaro Akase¹, Kazunori Iwamitsu¹, Toshiya Yokogawa¹, Shigetaka Tomiya¹ (1. NAIST (Japan))

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