[8] Session 8 (C. Nanotechnologies for Electronics)

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)

[8-04] Deep learning-based automated SEM image analysis pipeline for GaN trench structures

*Seiyo Nojima¹, Kazunori Iwamitsu¹, Zentaro Akase¹, Akihiko Kikuchi², Shigetaka Tomiya¹ (1. NAIST (Japan), 2. Sophia Univ. (Japan))

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