[P2] Poster Session 2

[P2-60] Analysis of trap levels using electron beam excitation thermoluminescence method

*Takumi Shinogi¹, Shuto Sugito¹, Jofu Furusawa¹, Haruki Fukada¹, Atsushi A. Yamaguchi¹ (1. Kanazawa Inst. of Tech. (Japan))

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