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[A-8-07]Prediction of defective product transitionin Custom-made EV resistance factories by LSTM-type time series data prediction

○Yuma Shirota1, Kosuke Kamijo1, Nari Tanabe1, Aya Ishigaki2 (1. Suwa University of Science, 2. Tokyo University of Science)
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Keywords:

Defective product prediction,IoT,Machine Learning,Long Term Short Memory,time series data