Presentation Information
[A-8-07]Prediction of defective product transitionin Custom-made EV resistance factories by LSTM-type time series data prediction
○Yuma Shirota1, Kosuke Kamijo1, Nari Tanabe1, Aya Ishigaki2 (1. Suwa University of Science, 2. Tokyo University of Science)
Keywords:
Defective product prediction,IoT,Machine Learning,Long Term Short Memory,time series data