The Institute of Electronics, Information and Communication Engineers General Conference
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Presentation Information

9:00 AM - 9:15 AM JST(12:00 AM - 12:15 AM UTC)

[B-5B-37]A Study of Internal Defect Rate for Defect Detection of Large Structures

○Takamasa Yoshida1, Fumiaki Nagase1, Tatsuya Nakatani1, Toshifumi Miyagi1 (1. NTT Access Network Service Systems Laboratories, NTT Corporation)

Keywords:

Large Structure,Defect Detection

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