The Institute of Electronics, Information and Communication Engineers General Conference
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Presentation Information

11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[C-10-08]Comparison between Y22/Y21 and Transient Signals for Trapping Response in GaN HEMT

○Toshiyuki Oishi1, Takumi Higashijima1, Ken Kudara2, Yutaro Yamaguchi2, Shitaro Shinjo2, Koji Yamanaka2 (1. Saga University, 2. Mitsubishi Electric Corporation)

Keywords:

GaN,trap,measurement

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