Presentation Information
[A-8-09]Prediction of Defective Product Transition in Custom-made EV Resistance Factories by Fast Tracking of Feed-forward LSTM
〇Aimi Kiriyama1, Yuma Shirota1, Nari Tanabe1, Aya Ishigaki2 (1. Suwa University of Science, 2. Tokyo University of Science)
Keywords:
IoT,Machine learning,Predicting the number of defective products,Prediction of number of defective products