Presentation Information

[A-8-09]Prediction of Defective Product Transition in Custom-made EV Resistance Factories by Fast Tracking of Feed-forward LSTM

〇Aimi Kiriyama1, Yuma Shirota1, Nari Tanabe1, Aya Ishigaki2 (1. Suwa University of Science, 2. Tokyo University of Science)

Keywords:

IoT,Machine learning,Predicting the number of defective products,Prediction of number of defective products

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