[BI-3] Measurement and Simulation Technologies for Micro EMC

2:05 PM - 2:30 PM JST(5:05 AM - 5:30 AM UTC)

[BI-3-01] DPI 試験結果と回路シミュレーションに基づく車載Ethernet 機器のBCI 試験結果予測

〇Yusuke Yano¹, Osami Wada², Koji Ichikawa², Jianqing Wang¹ (1. Graduate School of EngineeringGraduate School of Engineering, , 2. Center for Future Communications Research, Nagoya Institute of Technology)

Keywords:

EMC,Model-based design,DPI,BCI,Circuit simulation

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