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依頼シンポジウムセッションI. Symposium Session : BI-3．Measurement and Simulation Technologies for Micro EMC

[BI-3]Measurement and Simulation Technologies for Micro EMC

Thu. Mar 12, 2026 2:00 PM - 4:30 PM JST
Thu. Mar 12, 2026 5:00 AM - 7:30 AM UTC
Building 1 3F N302(Kyushu Sangyo University)
Chair:KOUJI ICHIKAWA(Nagoya Institute of Technology), Morioka Takehiro(National Institute of Advanced Industrial Science and Technology (AIST))
　Online Attendance (ZOOM)　
Recent EMC issues have become more complex due to the high-frequency signals and the speed of semiconductor-based switching. This has made it necessary to consider not only the effects between separated devices but also issues in smaller areas such as in a circuit board and nearby components. In such micro-EMC issues, simulation technology plays a crucial role, but the validity and reliability of these simulations can be confirmed by measurement data. In the present session, we will conduct a comprehensive consideration of numerical simulation and measurement techniques currently employed in the latest component-level EMC research.
2:00 PM - 2:05 PM JST(5:00 AM - 5:05 AM UTC)

[3N30204-08-1add]Chair Greeting

2:05 PM - 2:30 PM JST(5:05 AM - 5:30 AM UTC)

[BI-3-01]DPI 試験結果と回路シミュレーションに基づく車載Ethernet 機器のBCI 試験結果予測

〇Yusuke Yano1, Osami Wada2, Koji Ichikawa2, Jianqing Wang1 (1. Graduate School of EngineeringGraduate School of Engineering, , 2. Center for Future Communications Research, Nagoya Institute of Technology)
2:30 PM - 2:55 PM JST(5:30 AM - 5:55 AM UTC)

[BI-3-02]Comparison Between Measured and Simulated High-Speed Signal Waveforms and Efforts to Improve Simulation Accuracy

〇Akihiro Tanaka1, Shuhei Nozue1, Hideyuki Nakanishi1 (1. RITA Electronics, Ltd.)
2:55 PM - 3:20 PM JST(5:55 AM - 6:20 AM UTC)

[BI-3-03]A 110-GHz Probing System for S-parameter Measurements of Three-Dimensional Objects

〇Yoichi Sakuraba1, Masanori Shimasue1, Hiroyuki Shimada1, Yasuo Kawahara1, Takuya Adachi1, Takahito Motoki1, Takayuki Fukushi1, Yuma Nomura2, Yuta Tsubouchi2, Ryuichi Fujimoto2 (1. MoDeCH Inc., 2. Kioxia Corporation)
3:20 PM - 3:35 PM JST(6:20 AM - 6:35 AM UTC)

Break time

3:35 PM - 4:00 PM JST(6:35 AM - 7:00 AM UTC)

[BI-3-04]Evaluation of Parasitic Inductance in a Half-bridge Circuit for Noise Source Modeling

〇Takaaki Ibuchi1 (1. Univ. of Osaka)
4:00 PM - 4:25 PM JST(7:00 AM - 7:25 AM UTC)

[BI-3-05]Common-Mode Noise Mitigation and Simulation for High-Power-Density DC/DC Converters

〇Jun Imaoka Imaoka1 (1. Nagoya University)
4:25 PM - 4:30 PM JST(7:25 AM - 7:30 AM UTC)

[3N30204-08-8add]Closing Remarks

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