[BI-3] Measurement and Simulation Technologies for Micro EMC

2:30 PM - 2:55 PM JST(5:30 AM - 5:55 AM UTC)

[BI-3-02] Comparison Between Measured and Simulated High-Speed Signal Waveforms and Efforts to Improve Simulation Accuracy

〇Akihiro Tanaka¹, Shuhei Nozue¹, Hideyuki Nakanishi¹ (1. RITA Electronics, Ltd.)

Keywords:

High-Speed Signal Transmission,Signal Waveform Simulation,Power-Aware IBIS Model,DDR4-SDRAM,LPDDR4-SDRAM

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