[C-10] Electron Devices

9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)

[C-10-02] Reliability Improvement of Signal Readout Circuits for TFT Image Sensors

〇Hiroki Kobayashi¹, Koki Imamura¹, Masahide Goto¹, Hiroto Sato¹ (1. NHK Science & Technology Research Laboratories)

Keywords:

TFTs,Amorphous Oxide Semiconductors,Image Sensors