[C-11] Silicon Device and Materials

9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)

[C-11-03] A quasi-memristive behavior in SiO₂ nanofilms and its application to physical keys

〇Seiichi Sato Sato¹, Shido Onishi¹, Ritsuko Eguchi¹, Takahisa Ichinohe² (1. University of Hyogo, 2. NIT, Tokyo College)

Keywords:

Dynamic resistive behavior,Physical key,Chaos-based secure communication,Numerical simulation

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