[C-11] Silicon Device and Materials | General Conference of the Institute of Electronics, Information and Communication Engineers

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一般セッションC. Electronics Society : C-11．Silicon Device and Materials

[C-11]Silicon Device and Materials

Fri. Mar 13, 2026 9:00 AM - 10:30 AM JST
Fri. Mar 13, 2026 12:00 AM - 1:30 AM UTC

Building 2 4F 2E407(Kyushu Sangyo University)

Chair:Sadow Taizo(Kyushu University), HIROYA IKEDA(Shizuoka University)

9:00 AM - 9:15 AM JST(12:00 AM - 12:15 AM UTC)

[C-11-01]Seebeck coefficient of Si microribbon evaluated by Kelvin-probe force microscopy

〇Hiroya Ikeda¹, Yuto Nakahara¹, Haruya Ozaki¹, Koteeswaran Kalaiarasan¹, Faiz Salleh², Yasuhiro Hayakawa¹, Hiromu Hamasaki¹ (1. Shizuoka Univ., 2. Univ. Malaya)

9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)Candidate for Academic Incentive AwardCareer Explorer

[C-11-02]Control of Surface Microstructure of Silicon Wires Fabricated by Anodization

◎△Kozen Ikeda¹, Yoshiaki Hoshina¹, Yuki Nagasawa¹, Ryosuke Watanabe², Toshiaki Suzuki¹, Masaaki Niwa¹, Mitsuya Motohashi¹ (1. Tokyo Denki Univ., 2. Hirosaki Univ.)

9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)

[C-11-03]A quasi-memristive behavior in SiO₂ nanofilms and its application to physical keys

〇Seiichi Sato Sato¹, Shido Onishi¹, Ritsuko Eguchi¹, Takahisa Ichinohe² (1. University of Hyogo, 2. NIT, Tokyo College)

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[C-11-04]Investigation of high-speed HDR readout
using 3-step potential structure pixels

〇Shuhei Takemoto¹, Koki Fujiwara¹, Ken Miyauchi ^1,2, Hideki Owada², Chia Chi Kuo², Isao Takayanagi², Shunsuke Okura¹ (1. Ritsumeikan Univ., 2. Brillnics Japan)

10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)Candidate for Academic Incentive AwardCareer Explorer

[C-11-05]波動関数の時間発展を用いた二次元ナノスケール半導体中の不純物数推定

◎△Fugo Nashiki¹, Satoru Sugiyama¹, Yoshitaka Itoh¹, Masakazu Muraguchi¹, Tota Suko² (1. Hokkaido Univ. of Science, 2. Waseda Univ.)

10:15 AM - 10:30 AM JST(1:15 AM - 1:30 AM UTC)Candidate for Academic Incentive Award

[C-11-06]Error Factors in a Unified Space-Ground Environment Model for Soft-Error

◎Ryoya Sando¹, Daisuke Kobayashi^1,2 (1. EEIS/UTokyo, 2. ISAS/JAXA)

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