[C-11] Silicon Device and Materials

10:15 AM - 10:30 AM JST(1:15 AM - 1:30 AM UTC)Candidate for Academic Incentive Award

[C-11-06] Error Factors in a Unified Space-Ground Environment Model for Soft-Error

◎Ryoya Sando¹, Daisuke Kobayashi^1,2 (1. EEIS/UTokyo, 2. ISAS/JAXA)

Keywords:

soft error,semiconductor device,reliability,modeling,SRAM

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