[C-12] Integrated Circuit and Devices

4:15 PM - 4:30 PM JST(7:15 AM - 7:30 AM UTC)Candidate for Academic Incentive Award

[C-12-55] Proposal of HCI measurement circuit for ring oscillator with variable bias

◎Nagi Nozaki¹, Yuki Koyama¹, Kazutoshi Kobayashi¹, Jun Furuta², Ryo Kishida³, Nobukazu Takai¹, Mithuhiko Igarashi⁴, Shigetaka Kumashiro⁴, Michitarou Yabuuchi⁴, Hironori Sakamoto⁴ (1. Kyoto Institute of Technology, 2. Okayama Prefectural Univ, 3. Toyama Prefectural Univ, 4. Renesas Electronics)

Keywords:

HCI (Hot Carrier Injection),BTI (Bias Temperature Instability),Ring Oscillator (RO),Reliability Monitoring