Presentation Information

[C-14-13]光技術を用いたテラヘルツ帯Sパラメータ計測手法の実装と評価

〇Kota Nishimura1, Naoki Okada2, Shinya Ochi2, Takshi Sugiyama1, Shintaro Hisatake2 (1. Photonic Edge Inc., 2. Gifu University)

Keywords:

Terahertz wave,S-parameter measurement,Frequency Domain Spectroscopy,Photonics-based measurement,Material and device characterization