[C-3_C-4] Optoelectronics / Lasers and Quantum Electronics

9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)

[C-3_C-4-24] Reliability of inverted InGaAs/InP photodiode for beyond 200 Gbaud applications

〇Yuki Yamada¹, Ikue Hiraoka¹, Fumito Nakajima¹ (1. NTT Device Technology Laboratories)

Keywords:

Photodiode,High-speed,Reliability

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