Sessions(by Category)

I. Symposium Session : BI-3.Measurement and Simulation Technologies for Micro EMC

[BI-3]Measurement and Simulation Technologies for Micro EMC

Thu. Mar 12, 2026 2:00 PM - 4:30 PM JST
Thu. Mar 12, 2026 5:00 AM - 7:30 AM UTC
Building 1 3F N302(Kyushu Sangyo University)
Chair:KOUJI ICHIKAWA(Nagoya Institute of Technology), Morioka Takehiro(National Institute of Advanced Industrial Science and Technology (AIST))
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