Presentation Information
[AS-P-001-2]Analysis of OFF-state Threshold Voltage Instability on Vertical GaN-on-Si Trench MOSFETs
*Manuel Fregolent1,2、F. Bergamin1,2、D. Favero1,2、C. De Santi1,2、Andrea Cester1,2、C. Huber3、G. Meneghesso1,2、E. Zanon1,2、M. Meneghini1,2,4 (1. Department of Information Engineering, University of Padova, Padova, Italy 、2. UNET - National Interuniversity Consortium for Nanoelectronics, Italy 、3. Department for Advanced Technologies and Micro Systems, Robert Bosch GmbH, Renningen, Germany 、4. Department of Physics and Astronomy, University of Padova, Padova, Italy)