Presentation Information
[NNS-P-1-01]Defect Characterization in Carbon Auto-Doped GaN by Optical and Electrical Methods
*Anna Honda1, Hirotaka Watanabe1, Momoko Inayoshi3, Takeshi Kato1,2, Wakana Takeuchi3, Yoshio Honda1,2 (1. Institute of Materials and Systems for Sustainability, Nagoya University, 2. Department of Electronics, Nagoya University, 3. Department of Electrical and Electronic Engineering, Aichi Institute of Technology)
