[We-A2-H] Polarization and defect physics in nitrides

12:15 PM - 12:30 PM JST(3:15 AM - 3:30 AM UTC)

[We-A2-H-04] 3D Atomic-scale observation of stacking fault migration

〇Xifan Xu¹, Tao Wang¹, Xinqiang Wang¹ (1. Peking university (China))

Long considered immobile, stacking faults are shown here to migrate as prismatic faults in III-nitrides. Real-time 3D atomic-scale imaging reveals a low-barrier subplane-exchange pathway with minimal shuffling, while noncollinear climb mobilizes stair-rod locks, enabling defect annihilation and strongly reducing AlN defect density.