Presentation Information

[Tu-A1-H-01]GaN based devices: charge trapping, reliability physics and perspectives

〇Enrico Zanoni1, Francesco De Pieri1, Andrea Carlotto1, Samrat Roy Chowdhury1, Manuel Fregolent1, Isabella Rossetto1, Carlo De Santi1, Fabiana Rampazzo1, Gaudenzio Meneghesso1, Matteo Meneghini1 (1. University of Padova (Italy))

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