Presentation Information
[Tu-P-44]Comparison of Ag Addition and Oxygen Incorporation for p-type Conduction in Mg2Si Thin Films
〇Kaito Masuda1, Ryoga Toyama1, Hiroshi Katsumata1,2 (1. Graduate School of Sci. and Tech., Meiji Univ. (Japan), 2. School of Sci. and Tech., Meiji Univ. (Japan))
This study investigates impurity doping approaches to realize p-type Mg2Si thin films fabricated by RF magnetron sputtering. Oxygen introduction induced p-type conduction, likely due to interstitial oxygen acceptors, as predicted by DFT calculations, while Ag addition increased electron concentration through AgMg phase formation.
