Session Details

[Tu-P]Semiconductors for terahertz and mid infrared

Tue. Aug 18, 2026 5:45 PM - 7:30 PM JST
Tue. Aug 18, 2026 8:45 AM - 10:30 AM UTC
Kogakuin Univ. (Poster C3)(Poster)

[Tu-P-37]MIM Tunneling Transistor Platform: Applications for THz-Range High-Speed Switching

〇Jeong Hee Shin1, Su Jin Heo2, Jae Eun Jang3 (1. Korea Inst. of Ceramic Eng. and Tech. (KICET) (Korea), 2. Univ. of Cambridge (UK), 3. Daegu Gyeongbuk Inst. of Sci. and Tech. (DGIST) (Korea))

[Tu-P-38]Attempt at Electrical Readout of Resonant Polaron States
in a Charge Sensitive Infrared Phototransistor

〇Souichi Nakai1, Shogo Kaneko1, Takaki Fukumoto1, Susumu Komiyama2,3, Hiroaki Yasuda2, Norihiko Sekine2, Iwao Hosako2, Kenji Ikushima1 (1. Facluty of Engineering, Tokyo university of agriculture and technology (Japan), 2. National Institute of Information and Communications Technology (Japan), 3. Department of Basic Science, The University of Tokyo (Japan))

[Tu-P-39]Piezoresistive-Mode Operation of MEMS Bolometers Using n-type Modulation-Doped AlGaAs/GaAs Heterostructures

〇Kazuhiro Takahashi1,2,3, Naomi Nagai3, Atsushi Nakanishi1, Kazuyuki Kuroyama3, Kazuhiko Hirakawa2,3, Ya Zhang3 (1. Hamamatsu Photonics K.K. (Japan), 2. Tokyo univ. of Agriculture and Tech. (Japan), 3. Inst. of Indus. Sci., The Univ. of Tokyo (Japan))

[Tu-P-40]Electronic States of Above Barrier Energy in Strained InGaAs/GaAs Multiple Quantum Wells for Terahertz Wave Generation via Difference Frequency Mixing

〇Osamu Kojima1, Yasuki Nakajima1, Koudai Aoyama1, Takashi Kita2 (1. Chiba Inst. of Tech. (Japan), 2. Kobe Univ. (Japan))

[Tu-P-41]Cyclotron Resonant Nonlinear Hall Effect in 2D Valley Semiconductors via Skew Scattering

〇Valeriia Ivanova1, Vadim Kovalev2,3, Ivan Savenko1,4 (1. Guangdong Technion — Israel Inst. of Tech., 241 Daxue Road, Shantou, Guangdong, China, 515063 (China), 2. Rzhanov Inst. of Semiconductor Physics, Siberian Branch of the Russian Academy of Sci., Novosibirsk 630090, Russia (Russia), 3. Novosibirsk State Tech. Univ., Novosibirsk 630073, Russia (Russia), 4. Technion – Israel Inst. of Tech., Haifa, 3200003, Israel (Israel))

[Tu-P-43]Microwave Photoresistance in Weak Localization Regime in AlxGa1-xAs:Si 3D Epitaxial Layers

〇Alexandra Galeeva1, Stanislav Chmyr'1, Alexey Artamkin1, Dmitry Dolzhenko1, Mikhail Chernov2, Dmitry Khokhlov1,3 (1. M.V. Lomonosov Moscow State University (Russia), 2. A.F. Ioffe Physical Technical Institute (Russia), 3. P.N. Lebedev Physical Institute (Russia))

[Tu-P-44]Comparison of Ag Addition and Oxygen Incorporation for p-type Conduction in Mg2Si Thin Films

〇Kaito Masuda1, Ryoga Toyama1, Hiroshi Katsumata1,2 (1. Graduate School of Sci. and Tech., Meiji Univ. (Japan), 2. School of Sci. and Tech., Meiji Univ. (Japan))

[Tu-P-45]Optical and Electrical Evaluation of Excimer-Light-Induced
Surface Electric Fields in GaAs

〇Haruto Monda1, Kazuki Ueda1, Takayuki Hasegawa1, Hideo Wada1, Masatoshi Koyama1, Akihiko Fujii1, Akihiro Shimizu2, Toshihiko Maemoto1 (1. Osaka Inst. of Tech. (Japan), 2. Semiconductor Related Group, Marketing Management Division, Ushio Inc. (Japan))