Presentation Information
[Tu-P2-H-05]Tunneling transport via deep levels in p-type diamond Schottky barrier diodes
〇Makoto Kawano1, Yoshitaka Taniyasu1, Kazuyuki Hirama1 (1. NTTBRL (Japan))
We show that the carrier transport mechanism under reverse-bias conditions in permalloy/p-type boron-doped diamond Schottky barrier diodes with a boron concentration of 2.0 × 1018 cm−3 is trap-assisted tunneling via deep levels.
