Presentation Information
[We-A2-H-05]Using Hydrogen Plasma to Improve Breakdown Behavior in GaN-on-Si p–n Diodes
〇David Alejandro Plaza Arguello1, Nevine Rochat1, Zakariae M'Qaddem1, Thomas Kaltsounis, Hala El Rammouz1, Matthieu Lafossas1, Simona Torrengo1, Hassan Maher2, Thibaud Guillemin3, Yvon Cordier3, Julien Buckley1, Matthew Charles1 (1. Inst. CEA-LETI (France), 2. LN2, Univ. of Sherbrooke (Canada), 3. Inst. CRHEA, Univ. Côte d’Azur (France))
