Presentation Information
[We-P-100]Single-Shot Charge Detection via RF Reflectometry in a Planar p-Type Silicon Quantum Dot
〇Kenta Ebisawa1, Yusuke Sato1, Sayyid Irsyadul Ibad1, Ryutaro Matsuoka1, Itaru Yanagi2, Toshiyuki Mine2, Ryuta Tsuchiya2, Dai Hisamoto2, Hiroyuki Mizuno2, Shunsuke Ota1, Raisei Mizokuchi1, Tetsuo Kodera1 (1. Department of Electrical and Electronic Eng., Inst. of Sci. Tokyo (Japan), 2. Res. and Development Group, Hitachi, Ltd. (Japan))