Presentation Information
[Mo-1A-04]Insights on the role of NO annealing in the Dit generation in lateral MOSFETs during Gate Switching stress
*Patrick Fiorenza1, Marco Zignale1, Simone Milazzo1, Cateno Marco Camalleri2, Laura Scalia2, Mario Saggio2, Marilena Vivona1, Filippo Giannazzo1, Fabrizio Roccaforte1 (1. CNR-IMM (Italy), 2. STMicroelectronics (Italy))
