Presentation Information
[Mo-P-24]Semi-Insulating 4H-SiC: Can V4+ Photoluminescence Be Used as a Characterization Tool for V Concentration?
*Harmke Dorien van Dijk1, Matthieu Paillet1, Marcin Zielinski2, Rafał Jakieła3, Ahmed Azmi Zahab1, Jean Roch Huntzinger1, Hervé Peyre1, Sandrine Juillaguet1, Thomas Cohen1, Olivier Briot1 (1. L2C CNRS Université de Montpellier (France), 2. Soitec S.A. (France), 3. Inst. of Physics of the Polish Academy of Sciences (Poland))
