Presentation Information

[Mo-P-26]Annihilation and Local Unfaulting Inside a Triangular Double Shockley-type Stacking Fault in 4H-SiC Epitaxial layer

Soon-Ku Hong1, Moonkyong Na2, Dohyung Kim3, Hyundon Jung3, Natsuko ASANO Asano4, *shunsuke asahina4,5 (1. Chungnam National University (Japan), 2. Korea Electrotechnology Research Institute (Japan), 3. Horiba STEC Korea (Korea), 4. JEOL Ltd (Japan), 5. Tohoku University (Japan))