Presentation Information
[Mo-P-53]Curve Tracer Approach for Accurate Characterization of Output Characteristics of SiC MOSFETs in 1st and 3rd Quadrant
Maximilian Paul Goller1, *Mohamed Alaluss1, Madhu Lakshman Mysore1, Gengqi Li1, Dezhi Yang1, Josef Lutz1, Thomas Basler1 (1. Chemnitz University of Technology (Germany))