Presentation Information
[Mo-P-69]Polysilicon Gate and Silicon Nitride Dielectric Interactions in SiC Power MOSFETs: Implications for Reliable Operation
*Sami Bolat1, Pooria Asadollahi1, Edoardo Ceccarelli1, Marco Pocaterra1, Giovanni Alfieri1, Arne Benjamin Renz2, Mustafa Akif Yildirim2, Marina Antoniou2, Elizabeth Buitrago1 (1. Hitachi Energy (Switzerland), 2. Univ. of Warwick (UK))