Presentation Information
[Mo-P-70]Dual-functional Ni/4H-SiC Schottky interfaces: Robust UV and X-ray detection, imaging in extreme environments
*Chowdam Venkata Prasad1, Sunjae Kim2, Beomjun Park3, Geon-Hee Lee1, Jin-Woo Choi1, Jeongho Kim4, Wan Sik Hwang1, Jong-Min Oh1, Sang-Mo Koo1 (1. Kwangwoon University (Korea), 2. Korea Aerospace University (Korea), 3. Seoul National University (Korea), 4. Sungkyunkwan University School of Medicine (Korea))
