Presentation Information
[Mo-P-84]Thermal Structure Analysis of SiC JFETs Using Gate-Source Voltage Measurements
*Su Ik Park1, Joosun Yun2, Byongjin Ma3, Guesuk Lee3, Tae-Hee Jung3, Yu-Na Jung1, Gyu-Hyung Cho1, Youngbeom Kim1, Hyundon Jung1 (1. HORIBA STEC KOREA Ltd. (Korea), 2. ComPhysics (Korea), 3. Korea Electronics Tech. Inst. (Korea))
