Presentation Information

[Mo-P-92LN]HV-H3TRB Reliability and Failure Analysis of 13 kV SiC Devices

*Kohei Ebihara1, Kazuya Konishi1, Yukiyasu Nakao1, Katsutoshi Sugawara1, Tatsuro Watahiki1 (1. Mitsubishi Electric Corp. (Japan))