[IP] Invited Poster-Short Presentation

10:45 AM - 10:50 AM JST(1:45 AM - 1:50 AM UTC)

[IP-02] Thermal response of threading dislocations in SiC substrates using UV-excited lock-in thermography

*JUHYEONG Sun¹, Ryohei Fujita¹, Michio Kawase², Hosei Nagano¹, Masachi Kato³, Kenta Murayama⁴, Kentaro Kutsukake^1,2, Toru Ujihara^1,2, Shunta Harada^1,2 (1. Nagoya university (Japan), 2. Inst. of Materials and Systems for Sustainability (IMaSS) (Japan), 3. Nagoya Institute of Technology (Japan), 4. Mipox Corporation (Japan))