[Th-1A] Reliability

9:50 AM - 10:20 AM JST(12:50 AM - 1:20 AM UTC)

[Th-1A-01] Bipolar Degradation in SiC Power Devices: Still an Issue?
Recent Findings and Perspectives for Applications and Standardization

*Thomas Basler¹, Clemens Herrmann¹ (1. Chemnitz University of Technology, Germany (Germany))